Fig. 5

Nano-surface of protoplasts. AFM images of the surface of protoplasts cultured under the non-stress (a) and stress (b) conditions at 14 days of culture after washing with 0.3% SDS and 5% KOH. Upper images indicate light microscopic images of protoplasts observed on AFM sample glass slides. Middle images correspond to AFM height images of tapping mode, and the graphs indicate the cross-section height along the horizontal line in the middle image. The arrow heads indicate the measured points of the height in the graph